Jaguemont, J., Boulon, L., Venet, P., Dubé, Y. et Sari, A. (2016). Lithium-ion battery aging experiments at subzero temperatures and model development for capacity fade estimation. IEEE Transactions on Vehicular Technology, 65 (6). pp. 4328-4343. ISSN 0018-9545 DOI 10.1109/TVT.2015.2473841
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Résumé
Lithium-ion (Li-ion) batteries widely used in electric vehicles (EVs) and hybrid EVs (HEVs) are insufficient for vehicle use after they have degraded to 70% to 80% of their original capacity. Battery lifespan is a large consideration when designing battery packs for EVs/HEVs. Aging mechanisms, such as metal dissolution, growth of the passivated surface film layer on the electrodes, and loss of both recyclable lithium ions, affect the longevity of the Li-ion battery at higherature operations. Even vehicle maneuvers at low temperatures (T<0°C)contribute to battery lifetime degradation, owing to the anode electrode vulnerability to other degradation mechanisms such as lithium plating. Nowadays, only a few battery thermal management schemes have properly considered lowerature degradation. This is due to the lack of studies on aging of Li-ion batteries at sub-zero temperature. This paper investigates how load cycle and calendar life properties affect the lifetime and aging processes of Li-ion cells at low temperatures. Accelerated aging tests were used to determine the effect of the ambient temperature on the performance of three 100-Ah LiFeMnP04 Li-ion cells. Two of them were aged through a normalized driving cycle at two temperature tests (-20°C and 25°C). The calendar test was carried out on one single battery at -20 °C and mid-range of state of charge (50%). Their capacities were continuously measured every two or three days. An aging model is developed and added to a preliminary single-cell electrothermal model to establish, in future works, a thermal strategy capable of predicting how the cell ages. This aging model was then validated by comparing its predictions with the aging data obtained from a cycling test at 0 °C. © 1967-2012 IEEE.
Type de document: | Article |
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Date de dépôt: | 22 janv. 2020 14:18 |
Dernière modification: | 22 janv. 2020 14:18 |
Version du document déposé: | Post-print (version corrigée et acceptée) |
URI: | https://depot-e.uqtr.ca/id/eprint/9028 |
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